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Semiconductor

PICHP Test Handler
Device PICHP06-15
UPH Min 3.0k/Hr including tester testing time
Up-time More than 98%
Maintenance operation time Continuous 3 hours
Test YLD 99.5%
Compressed Air 3~5 Kg/Cm²
Dimension(mm) 2,200(W) x 1,400(D) x 2,000(H)
This machine conducts electrical tests at both high and room temperature and sorts out the good components while rejecting the bad ones based on the test.
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