Flexible Test Handler

Multiple test function
Isolation test, AC/DC test
Laser marking function
chamber type with dust collector & brush cleaning
Multiple vision inspection function
Marking, lead and package inspection
Auto reject bin sorting function
Good and reject package bin sorting according to test and vision inspection result
Cycle time
3.5 sec
Maximum UPH
1,000ea (at 0~2 sec. test time)

This machine automatically sorts semiconductor devices into good and reject package bins based on the results of multiple tests. It can perform both isolation and AC/DC tests. It has a multiple vision inspection function, laser marking function, lead and package inspection function, and it is equipped with a chamber with a dust collector for brush cleaning.

 Flexible Test Handler 상세정보 안내

Flexible Test Handler

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